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By use of unconventional electron microscopical measurement methods, like cathodoluminescence or X-ray fluorescence, important material properties may be investigated on a micrometer scale which are not accessible by imaging or traditional analysing methods alone.

EMSystems (founded 2001) produces and sells innovative analysing systems enabling cathodoluminescence- or X-ray fluorescence measurements as accessory equipments on electron microscopes.

The range of equipment consists of:

SEMCL:
Imaging cathodoluminescence spectrometer
SEMCL View:
Cathodoluminescence imaging system
SEMRAY:
X-ray fluorescence measurement system

A remarkable number of international customers put their confidence on us. In the future we want to fulfill your expectations, too.

Please get into contact with us !